Apparatus and method for imaging the surface of a sample
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Microscope, in particular a scanning probe microscope provided with a programmable logic
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Laser microscope pulse forced mode raster surface inspection process, digitizing information to generate real time force-time graph profile
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Process for imaging a sample surface using a scanning probe and scanning probe microscope
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Aperture in a semiconductor material and production of the aperture and use
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combination microscope
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Near-field optical probe and near-field optical microscope
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Method and device for the simultaneous determination of at least two material properties of a sample surface, including the adhesion, the friction, the surface topography and the elasticity and rigidity
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Optical microscope for use in either near field mode or conventional, confocal mode, where near field probe casing is interchangeable with objective system
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Near field optical probe for optical microscope, for use in either near field or conventional mode; has near field optical probe holder that also houses near field probe tip, where whole casing is interchangeable with objective system
