| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 3 | |
| #2 | Republic of Korea | 3 | |
| #3 | United States | 3 | |
| #4 | Germany | 1 | |
| #5 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Machines |
| # | Technology | |
|---|---|---|
| #1 | Scanning-probe techniques | |
| #2 | Unspecified technologies | |
| #3 | Unspecified technologies | |
| #4 | Analysing materials |
| # | Name | Total Patents |
|---|---|---|
| #1 | Morimoto Takafumi | 9 |
| #2 | Murayama Ken | 8 |
| #3 | Kuroda Hiroshi | 7 |
| #4 | Nagano Yoshiyuki | 7 |
| #5 | Yanagimoto Hiroaki | 7 |
| #6 | Hiroki Takenori | 7 |
| #7 | Miwa Shigeru | 7 |
| #8 | Kunitomo Yuuichi | 6 |
| #9 | Kurenuma Tooru | 5 |
| #10 | Kenbou Yukio | 4 |
| Publication | Filing date | Title |
|---|---|---|
| DE102006039651A1 | Cantilever and tester | |
| KR20060031694A | Probe replacing method for scanning probe microscope |