Learn more

LG SILTRON INC

Overview
  • Total Patents
    1,147
  • GoodIP Patent Rank
    4,303
  • Filing trend
    ⇩ 100.0%
About

LG SILTRON INC has a total of 1,147 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2009. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets semiconductors, surface technology and coating and machine tools are BEIJING TONGMEI XTAL TECH CO LTD, SILTRONIC AG and SILTRON INC.

Patent filings per year

Chart showing LG SILTRON INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Na Gwang Ha 38
#2 Kim Sang Hee 37
#3 Hong Young Ho 36
#4 Choi Il Soo 33
#5 Hwang Jung Ha 31
#6 Ahn Jin Woo 27
#7 Kim Se Hun 26
#8 Yong Mun Suk 25
#9 Kim Do Yeon 24
#10 Kim Bong Woo 24

Latest patents

Publication Filing date Title
KR20170081562A Ingot growth control device and control method of it
KR101721211B1 Method for analyzing silicon monocrystalline wafer, the wafer manufactured by the method
KR20170091931A Method of controling a flatness of a epitaxial wafer
KR20170089672A Wafer polishing apparatus and Control method of the same
KR20170089702A Method for Silicon Single Crystal
KR20170089238A Method for removing Contamination of Wafer Furnace
KR20170088120A Single crystal ingot growth apparatus and the growing method of it
KR20170087766A Polisher for notch of wafer
KR101759878B1 Method for evaluating of silicon wafer
KR20170084785A Method for analyzing wafer
KR20170084429A Method of manufacturing an epitaxial wafer
KR20170083383A Apparatus for Growing Epitaxial Wafer
WO2017026603A1 Wafer polishing device and method for operating same
KR20170081943A Wafer polishing apparatus and method
KR20170081928A An dressing apparatus
KR101721167B1 Method of analyzing metal contamination of a wafer
KR20170081499A Single crystal ingot growing apparatus and the anti-vibration plate applied to it
KR20170079918A Method for evaluating a defect of a wafer
KR20170079371A Method for Silicon Single Crystal
KR20170077394A Apparatus for slicing a ingot