| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Israel | 11 | |
| #2 | EPO (European Patent Office) | 2 | |
| #3 | United States | 2 | |
| #4 | China | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology | |
| #3 | Semiconductors | |
| #4 | Optics | |
| #5 | Electrical machinery and energy |
| # | Name | Total Patents |
|---|---|---|
| #1 | Peter Rose | 8 |
| #2 | Ellis Chang | 5 |
| #3 | Khurram Zafar | 5 |
| #4 | Allen Park | 5 |
| #5 | Sagar Kekare | 5 |
| #6 | Brian Duffy | 4 |
| #7 | Ashok Kulkarni | 4 |
| #8 | Gordon Rouse | 4 |
| #9 | Kais Maayah | 4 |
| #10 | Chang Ellis | 2 |
| Publication | Filing date | Title |
|---|---|---|
| US9805910B1 | Automated SEM nanoprobe tool | |
| CN105652589A | Methods and systems for inspection of wafers and reticles using designer intent data |