| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Taiwan | 6 | |
| #2 | EPO (European Patent Office) | 4 | |
| #3 | Japan | 4 | |
| #4 | Hong Kong | 3 | |
| #5 | Malaysia | 2 | |
| #6 | WIPO (World Intellectual Property Organization) | 2 | |
| #7 | Canada | 1 | |
| #8 | Israel | 1 | |
| #9 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Semiconductors | |
| #2 | Measurement | |
| #3 | Audio-visual technology | |
| #4 | Computer technology | |
| #5 | Packaging and shipping | |
| #6 | Environmental technology | |
| #7 | Optics | |
| #8 | Control | |
| #9 | Machines |
| # | Name | Total Patents |
|---|---|---|
| #1 | Heng Lee Kwang | 8 |
| #2 | Jin Jian Ping | 8 |
| #3 | Amanullah Ajharali | 7 |
| #4 | Lin Jing | 6 |
| #5 | Ajharali Amanullah | 4 |
| #6 | Ge Han Cheng | 3 |
| #7 | Wong Kok Weng | 3 |
| #8 | Wong Kok-Weng | 2 |
| #9 | Ge Han-Cheng | 2 |
| #10 | Gan Tai Heng | 2 |
| Publication | Filing date | Title |
|---|---|---|
| WO2017086877A1 | Apparatus and method for cleaning a wafer table surface and/or an object disposed thereon | |
| EP3173773A1 | System and method for inspecting a wafer | |
| MY160426A | Patterned wafer defect inspection system and method |