GB9421977D0
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A scan latch and test method therefor
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GB9419689D0
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Off-chip driver circuit
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GB9417592D0
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Single clock scan latch
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GB9417591D0
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Scan testable double edge triggered scan cell
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GB9417589D0
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Scan test
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GB9417602D0
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A controller for implementing scan testing
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GB9417590D0
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Scan latch
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GB9417244D0
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Integrated circuit device and test method therefor
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GB9417269D0
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Memory and test method therefor
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GB9417266D0
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Testing a non-volatile memory
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GB9417297D0
|
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Method and apparatus for testing an integrated circuit device
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GB9417268D0
|
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Testing an integrated circuit device
|
GB9417265D0
|
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Controlling capacitive load
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GB9417270D0
|
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Timing circuit
|
GB9417264D0
|
|
Memory device
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GB9417271D0
|
|
Memory device
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GB9417267D0
|
|
Current generator circuit
|
GB9414928D0
|
|
Off-chip driver circuit
|
GB9412487D0
|
|
A computer system for executing branch instructions
|
GB9412434D0
|
|
Computer instruction compression
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