| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Canada | 5 | |
| #2 | WIPO (World Intellectual Property Organization) | 5 | |
| #3 | EPO (European Patent Office) | 3 | |
| #4 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Measuring length, angles and areas | |
| #3 | Image data processing |
| # | Name | Total Patents |
|---|---|---|
| #1 | Czubko Myron | 6 |
| #2 | Parker Jeffrey B | 5 |
| #3 | Laplant Frederick P | 4 |
| #4 | White Jeffrey S | 4 |
| #5 | Dixon John W | 4 |
| #6 | Haven Neil | 3 |
| #7 | Haven G Neil | 3 |
| #8 | Czubko Brian J | 2 |
| #9 | Czubko Brian James | 2 |
| #10 | Parker Jeffrey Brent | 2 |
| Publication | Filing date | Title |
|---|---|---|
| CA2272954A1 | Method and system for processing measurement signals to obtain a value for a physical parameter | |
| WO9740367A1 | Method and system for inspecting a low gloss surface of an object at a vision station | |
| US5078496A | Machine vision surface characterization system |