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HITACHI ELECTR ENG

Overview
  • Total Patents
    3,531
About

HITACHI ELECTR ENG has a total of 3,531 patent applications. Its first patent ever was published in 1976. It filed its patents most often in Japan, United States and Republic of Korea. Its main competitors in its focus markets measurement, audio-visual technology and semiconductors are SORD COMPUTER SYST, BASLER GMBH and AOTI OPERATING CO INC.

Patent filings in countries

World map showing HITACHI ELECTR ENGs patent filings in countries

Patent filings per year

Chart showing HITACHI ELECTR ENGs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hirokawa Hideo 115
#2 Takami Katsumi 92
#3 Wada Noriya 86
#4 Nemoto Ryoji 81
#5 Mori Kyoichi 71
#6 Tajima Sumio 71
#7 Oyama Katsumi 70
#8 Yamaha Tsuneo 65
#9 Aiko Kenji 63
#10 Nakadai Tsutomu 55

Latest patents

Publication Filing date Title
JP2004205985A Resin coating method of panel, manufacturing method and resin coating device of panel for display
US7035039B2 Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridge
JP2004186289A Etching method and apparatus thereof
JP2004170092A Surface inspection method and surface inspection apparatus
JP2004170079A Testing waveform supply method, semiconductor testing method, driver, and semiconductor testing apparatust
JP2004165331A Local cleaning transfer chamber and local cleaning treatment equipment
JP2004158351A Socket board for ic device test
JP2004145986A Method for measuring noise characteristics of magnetic head and measuring device
JP2004138552A Ic socket
JP2004140058A Wafer conveying device and wafer processing apparatus
JP2004140057A Wafer positioning device
JP2004125342A Control method and device for air knife drying
JP2004108841A Semiconductor testing apparatus
JP2004108840A Semiconductor testing apparatus
JP2003272326A Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier, and head cartridge
JP2004103881A Socket for semiconductor device
JP2004101340A Ic testing method and ic testing device using the testing method
JP2004088515A Method and device for inspecting adc
JP2004085778A Contact exposure method and contact exposure apparatus
JP2004078108A Mask plate fixing fixture for exposure device