Learn more

NEXTIN INC

Overview
  • Total Patents
    17
  • GoodIP Patent Rank
    156,888
  • Filing trend
    0.0%
About

NEXTIN INC has a total of 17 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2013. It filed its patents most often in Republic of Korea, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets semiconductors, measurement and audio-visual technology are LEHIGHTON ELECTRONICS INC, SUPRASENSOR TECH LLC and RISOTETSUKU JAPAN KK.

Patent filings in countries

World map showing NEXTIN INCs patent filings in countries

Patent filings per year

Chart showing NEXTIN INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Park Tae Hoon 14
#2 Ram Segal 5
#3 Ophir Gvirtzer 3
#4 Jeong Jun Hee 3
#5 Lee Jun Ho 2
#6 Ehud Gabai 2
#7 Song Je Heon 1
#8 Lee Kwang Sae 1
#9 Kim Young Sun 1
#10 Ji Eui Chul 1

Latest patents

Publication Filing date Title
KR20190082508A method of testing 3D type multi layer semiconductor device in the process of stacking chip
KR20190070566A apparatus for testing particle in peripheral region of wafer and method for testing wafer
KR20170078902A method of detecting pattern image in substrate and method of inspecting substrate using the same
KR101647688B1 method of learning automatically die size and die number in a mask
KR20150086447A system for inspection and repair for substrate of OLED display
KR101652356B1 optical apparatus for examining pattern image of semiconductor device
KR101652355B1 optical apparatus for examining pattern image of semiconductor wafer
WO2015080480A1 Wafer image inspection apparatus
KR101545186B1 method of correction of defect location using predetermined wafer image targets
KR101523336B1 apparatus for examining pattern image of semiconductor wafer
KR101471391B1 Testing method for oled display device and tester for the same
KR20150025777A method of segmentation of die image for semiconductor device examination
KR101391840B1 Pixel array tester for organic light emitting diode pannel and method for the array testing
KR101379448B1 Apparatus for examining pattern image of semiconductor wafer using multiple light device
KR101403469B1 Apparatus for examining pattern image of semiconductor wafer using separated mirror type image devider
KR20140093354A Organic light emitting diode display device and test method thereof