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HITACHI HIGH TECH ELECT ENG CO

Overview
  • Total Patents
    97
About

HITACHI HIGH TECH ELECT ENG CO has a total of 97 patent applications. Its first patent ever was published in 2001. It filed its patents most often in Japan, United States and Republic of Korea. Its main competitors in its focus markets audio-visual technology, measurement and semiconductors are HITACHI ELECTR ENG, DYNAPERT PRECIMA LTD and CAMTEK LTD.

Patent filings in countries

World map showing HITACHI HIGH TECH ELECT ENG COs patent filings in countries
# Country Total Patents
#1 Japan 82
#2 United States 11
#3 Republic of Korea 3
#4 Taiwan 1

Patent filings per year

Chart showing HITACHI HIGH TECH ELECT ENG COs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Moriguchi Yoshihiro 9
#2 Wada Kenya 6
#3 Izaki Makoto 6
#4 Kato Noboru 6
#5 Onoshiro Jun 5
#6 Onoshiro Atsushi 5
#7 Kataho Hideaki 4
#8 Muneto Masatoshi 4
#9 Sato Kimiharu 4
#10 Suzuki Shinji 4

Latest patents

Publication Filing date Title
JP2006214903A Construction gauge obstructing object sensitive device
JP2006202877A Semiconductor device mounting device
JP2006194755A Substrate inspection device and substrate inspection method
JP2006194754A Substrate inspection device and method
JP2006179107A Magnetic characteristic inspection device and inspection method using the same
JP2006172930A Vacuum vapor deposition method and el display panel
JP2006167529A Apparatus and method for cleaning of substrate and method of manufacturing substrate
JP2006138754A Disc surface inspection method and its device
JP2006112933A Alignment mark inspection method and program
JP2006096491A Substrate drier
JP2006085792A Equalizer circuit and inspection device for hard disk
JP2006078713A Work identification information reading device and method
JP2006066747A Positioning apparatus and method of substrate
JP2006059506A Magnetic disk inspection device
JP2006030118A Foreign matter inspecting device and foreign matter inspection method
JP2006030039A Height measuring method, height measuring device, and signal processing method
JP2006026513A Resin application detecting method and resin applicator
JP2006033003A Signal amplification method, signal amplifier, and foreign material inspection method
JP2006015189A Disc-cleaning apparatus
JP2006013218A Spin processor for substrate, method for manufacturing substrate and electronic device