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Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
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Integrated optical nanoscale probe
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Photon emitter characterization using photoluminescence quenching in nitrogen vacancy color centers
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Magnetic write head characterization with nano-meter resolution using nitrogen vacancy color centers
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Magneto-optical detection of a field produced by a sub-resolution magnetic structure
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Metrology for contactless measurement of electrical resistance change in magnetoresistive samples
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Spectral noise analysis for read head structures
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Determining A Magnetic Sample Characteristic Using A Magnetic Field From A Domain Wall
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Closed loop magnet control for magnetic recording head testing apparatus
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In-plane magnetic field generation and testing of magnetic sensor
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Magnetoresistive element lifecycle tester with temperature control
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Magnetoresistive element lifecycle tester
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Magnetic head tester
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