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ELLIPSO TECHNOLOGY CO LTD

Overview
  • Total Patents
    17
About

ELLIPSO TECHNOLOGY CO LTD has a total of 17 patent applications. Its first patent ever was published in 2001. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and Australia. Its main competitors in its focus markets measurement, optics and electrical machinery and energy are UNITY SEMICONDUCTOR, GASERA LTD and MECTRON ENG CO.

Patent filings in countries

World map showing ELLIPSO TECHNOLOGY CO LTDs patent filings in countries

Patent filings per year

Chart showing ELLIPSO TECHNOLOGY CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kim Sang Youl 10
#2 Kim Sang-Youl 5
#3 Kim Sang Jun 5
#4 Kim Sang-Jun 4
#5 An Sung Hyuck 2
#6 Kim Sang Yeol 2
#7 Lee Jong Ung 1
#8 Yoon Hee Kuy 1
#9 Lim Joung Min 1
#10 Kim Do Hyeong 1

Latest patents

Publication Filing date Title
KR20140000380A Microscope for inspecting ito pattern of touch-screen panel and method thereof
KR101150943B1 Method for measuring film thickness of sample with textured surface
KR20110093253A Apparatus for measuring of aligning state of alignment layer and method for measuring tht same
KR20100033164A Spectroscopic ellipsometer with a microspot module
KR100845778B1 An apparatus for measuring thinkness of silicon wafer using light transmittance at light transmission edge range and a method therof
KR100650511B1 3-dimensional light extinction structure using vertical polarizing plate
KR100612135B1 Method for measuring absorbtion axis mis-alignment of polarizing plate
KR100479835B1 An apparatus for measuring thickness of mgo protection film on pdp upper glass substrate
KR20060014712A An apparatus for measuring optic axis off-alignment of polarizing plate and phase retardation plate and method thereof
KR100393522B1 Device and method for measuring film thickness, making use of improved fast fourier transformation
KR20030086698A Optical imageing system to monitor inside of furnaces
KR20030049473A Ultra high speed spectroscopic ellipsometer