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Microscope for inspecting ito pattern of touch-screen panel and method thereof
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Method for measuring film thickness of sample with textured surface
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Apparatus for measuring of aligning state of alignment layer and method for measuring tht same
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Spectroscopic ellipsometer with a microspot module
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An apparatus for measuring thinkness of silicon wafer using light transmittance at light transmission edge range and a method therof
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3-dimensional light extinction structure using vertical polarizing plate
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Method for measuring absorbtion axis mis-alignment of polarizing plate
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An apparatus for measuring thickness of mgo protection film on pdp upper glass substrate
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An apparatus for measuring optic axis off-alignment of polarizing plate and phase retardation plate and method thereof
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Device and method for measuring film thickness, making use of improved fast fourier transformation
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Optical imageing system to monitor inside of furnaces
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Ultra high speed spectroscopic ellipsometer
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