Learn more

CANDELA INSTR

Overview
  • Total Patents
    22
About

CANDELA INSTR has a total of 22 patent applications. Its first patent ever was published in 1998. It filed its patents most often in United States, Australia and EPO (European Patent Office). Its main competitors in its focus markets measurement, semiconductors and optics are UNIVERSAL KIKI KK, IMS MESSSYSTEME GMBH and KANO YOSHIO.

Patent filings per year

Chart showing CANDELA INSTRs patent filings per year from 1900 to 2020

Focus industries

Top inventors

# Name Total Patents
#1 Meeks Steven W 21
#2 Kudinar Rusmin 13
#3 Soetarman Ronny 4
#4 Meeks Steve W 1
#5 Lane Gale A 1

Latest patents

Publication Filing date Title
US7123357B2 Method of detecting and classifying scratches and particles on thin film disks or wafers
US6781103B1 Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disks
US6909500B2 Method of detecting and classifying scratches, particles and pits on thin film disks or wafers
EP1245922A1 System for measuring phase differences in reflected light signals
US6897957B2 Material independent optical profilometer
US6757056B1 Combined high speed optical profilometer and ellipsometer
US6392749B1 High speed optical profilometer for measuring surface height variation
AU5780900A System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern
US6665078B1 System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers
US6031615A System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness