UNITY SEMICONDUCTOR has a total of 80 patent applications. It decreased the IP activity by 60.0%. Its first patent ever was published in 2008. It filed its patents most often in EPO (European Patent Office), WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement, semiconductors and optics are MECTRON ENG CO, KANO YOSHIO and IMS MESSSYSTEME GMBH.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 16 | |
#2 | WIPO (World Intellectual Property Organization) | 16 | |
#3 | China | 10 | |
#4 | Taiwan | 10 | |
#5 | France | 9 | |
#6 | United States | 8 | |
#7 | Republic of Korea | 7 | |
#8 | Singapore | 4 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Semiconductors | |
#3 | Optics | |
#4 | Surface technology and coating | |
#5 | Audio-visual technology |
# | Name | Total Patents |
---|---|---|
#1 | Gastaldo Philippe | 36 |
#2 | Durand De Gevigney Mayeul | 28 |
#3 | Fresquet Gilles | 15 |
#4 | Courteville Alain | 11 |
#5 | Boulanger Jean-François | 8 |
#6 | Petitgrand Sylvain | 8 |
#7 | Combier Tristan | 8 |
#8 | Boulanger Jean-Francois | 6 |
#9 | Thouy Benoit | 6 |
#10 | Godny Stephane | 4 |
Publication | Filing date | Title |
---|---|---|
WO2020074800A1 | Dark-field optical inspecting device | |
FR3099569A1 | device for inspecting a surface of an object | |
FR3089286A1 | Method and system for measuring a surface of an object comprising different structures by low coherence interferometry | |
WO2018219785A1 | Method and system for reconstituting colour information of a sample measured by white light optical profilometry, and applications of said method | |
FR3079313A1 | MICROSCOPE LIGHTING DEVICE | |
FR3077631A1 | METHOD AND DEVICE FOR INSPECTING A SURFACE OF AN OBJECT CONTAINING DISSIMILAR MATERIALS | |
FR3076618A1 | METHOD AND SYSTEM FOR OPTICALLY INSPECTING A SUBSTRATE | |
KR20170066375A | Method and system for inspecting transparent wafers for electronics, optics or optoelectronics | |
EP2401574A1 | Device and method for inspecting semiconductor wafers |