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WUHAN EOPTICS TECH CO LTD

Overview
  • Total Patents
    18
  • GoodIP Patent Rank
    93,795
  • Filing trend
    ⇧ 300.0%
About

WUHAN EOPTICS TECH CO LTD has a total of 18 patent applications. It increased the IP activity by 300.0%. Its first patent ever was published in 2016. It filed its patents most often in China and United States. Its main competitors in its focus markets measurement, optics and micro-structure and nano-technology are UNITY SEMICONDUCTOR, MECTRON ENG CO and NEW KURIEISHIYON KK.

Patent filings in countries

World map showing WUHAN EOPTICS TECH CO LTDs patent filings in countries
# Country Total Patents
#1 China 17
#2 United States 1

Patent filings per year

Chart showing WUHAN EOPTICS TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Zhang Chuanwei 15
#2 Liu Shiyuan 15
#3 Li Weiqi 13
#4 Guo Chunfu 12
#5 Chen Jun 6
#6 Yang Kang 3
#7 Chen Xiuguo 3
#8 Wang Xinhui 3
#9 Liu Xianyi 2
#10 Chen Wei 2

Latest patents

Publication Filing date Title
CN111366087A But local measurement's microscopic imaging film thickness measuring device
CN111426275A Thin film measuring method
CN111122460A Single-rotation compensator type spectroscopic ellipsometer parameter calibration method and device
CN111121653A Single-layer film critical thickness estimation value calculation method
CN111209661A Spectral ellipsometry bandwidth and numerical aperture depolarization effect correction modeling method and device
CN111142587A Control method of dual-rotation compensator Mueller matrix ellipsometer system
CN111121652A Optical microscopic film thickness meter capable of realizing local measurement
CN111220543A Control method of single-rotation compensator spectrum type ellipsometer system
CN111122459A Method and device for correcting depolarization effect caused by uneven thickness in spectroscopic ellipsometry
CN111122458A Random error evaluation method for single-rotation compensator type ellipsometer
CN109470154A Value measurement method at the beginning of a kind of film thickness suitable for spectroscopic ellipsometers
CN109580054A A kind of transparent substance stress detector and its method
CN109580551A A kind of Fourier transform infrared Muller matrix ellipsometer and its measurement method
CN108535198A A kind of characterizing method of organic photoelectrical material molecularly oriented
CN106595521A Vertical objective lens type Muller matrix imaging ellipsometer based on liquid crystal phase modulation
CN106517086A Large-area high-resolution wide-field online measurement device and measurement method thereof
CN106500844A A kind of clematis stem road point amplitude high speed Stokes polarimeter and its measurement method of parameters