MECTRON ENG CO has a total of 20 patent applications. Its first patent ever was published in 1993. It filed its patents most often in EPO (European Patent Office), United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, optics and electrical machinery and energy are KANO YOSHIO, IMS MESSSYSTEME GMBH and NASH & HARRISON LTD.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 5 | |
#2 | United States | 5 | |
#3 | WIPO (World Intellectual Property Organization) | 5 | |
#4 | Canada | 4 | |
#5 | China | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Optics | |
#3 | Electrical machinery and energy |
# | Technology | |
---|---|---|
#1 | Measuring length, angles and areas | |
#2 | Analysing materials | |
#3 | Optical systems | |
#4 | Electric discharge tubes |
# | Name | Total Patents |
---|---|---|
#1 | Hanna James L | 17 |
#2 | Hanna James Lee | 3 |
#3 | Smith Donald R | 2 |
#4 | Gram Glenn D | 1 |
Publication | Filing date | Title |
---|---|---|
US2015061496A1 | System for Generating High Speed Flow of an Ionized Gas | |
US2006236792A1 | Workpiece inspection system | |
US2005174567A1 | Crack detection system | |
EP1206676A1 | Optical sub-pixel parts inspection system | |
CA2379561A1 | Optical beam shaper | |
EP1127244A1 | Inspection system for flanged bolts | |
CA2160906A1 | Non-contact inspection system | |
US5383021A | Optical part inspection system |