|
US8525169B1
|
|
Reliable physical unclonable function for device authentication
|
|
US2014042628A1
|
|
Structure with sub-lithographic random conductors as a physical unclonable function
|
|
US2014042627A1
|
|
Electronic structure containing a via array as a physical unclonable function
|
|
US2012306017A1
|
|
Wiring switch designs based on a field effect device for reconfigurable interconnect paths
|
|
US2013307153A1
|
|
Interconnect with titanium-oxide diffusion barrier
|
|
US2013307150A1
|
|
Copper interconnect structure and its formation
|
|
US8497202B1
|
|
Interconnect structures and methods of manufacturing of interconnect structures
|
|
US2012228771A1
|
|
Semiconductor interconnect structure with multi-layered seed layer providing enhanced reliability and minimizing electromigration
|
|
US2012061838A1
|
|
Barrier layer formation for metal interconnects through enhanced impurity diffusion
|
|
US2011266682A1
|
|
Microelectronic structure including air gap
|
|
US2011180309A1
|
|
Interconnect structure employing a Mn-group VIIIB alloy liner
|
|
US2010181678A1
|
|
Structure with self aligned resist layer on an interconnect surface and method of making same
|
