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DELTA DESIGN INC

Overview
  • Total Patents
    184
  • GoodIP Patent Rank
    22,431
  • Filing trend
    ⇧ 6.0%
About

DELTA DESIGN INC has a total of 184 patent applications. It increased the IP activity by 6.0%. Its first patent ever was published in 1965. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Taiwan. Its main competitors in its focus markets measurement, semiconductors and control are MICROELECTONICS TECHNOLOGY INC, TECHWING CO LTD and TRANSLARITY INC.

Patent filings per year

Chart showing DELTA DESIGN INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Tustaniwskyj Jerry Ihor 49
#2 Ding Kexiang Ken 39
#3 Kabbani Samer 35
#4 Babcock James Wittman 29
#5 Stuckey Larry 18
#6 Uekert Kenneth B 16
#7 Frandsen James 14
#8 Do Chris 11
#9 Laver Michael Anthony 11
#10 Turner Jonathan E 10

Latest patents

Publication Filing date Title
WO2020014163A1 Assembly and sub-assembly for thermal control of electronic devices
TW201923278A System and method for liquid nitrogen recycling
US2018218926A1 Active thermal control head having actuatable cold capacitor
US2019101588A1 Vision alignment system outside of test site
TW201810483A Offline vision assist method and apparatus for integrated circuit device vision alignment
US2018052188A1 Test handler head having reverse funnel design
KR20190038863A IMAGE-based IC tray pocket detection system
US2017285102A1 Ic test site vision alignment system
US2018196084A1 Socket side thermal system
US2017067960A1 Alignment mechanism
US2017045577A1 IC device-in-pocket detection with angular mounted lasers and a camera
WO2017015052A1 Continuous fluidic thermal interface material dispensing
TW201708782A Leak tolerant liquid cooling system employing improved air purging mechanism
US2015369861A1 Group vision alignment for double sided IC device testing
US2015015286A1 Micro-vision alignment system with guiding rings for IC testing
US2014347446A1 Method and apparatus for IC 3D lead inspection having color shadowing
TW201619729A System and method for accelerating a device
WO2011115978A1 Side gripping mechanism and device handlers having same
JP2011022135A Temperature measurement using diode by offsetting saturation current
US2011010122A1 Calibrating separately located cameras with a double sided visible calibration target for ic device testing handlers