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YEST CO LTD

Overview
  • Total Patents
    137
  • GoodIP Patent Rank
    17,520
  • Filing trend
    ⇩ 46.0%
About

YEST CO LTD has a total of 137 patent applications. It decreased the IP activity by 46.0%. Its first patent ever was published in 2007. It filed its patents most often in Republic of Korea and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets semiconductors, optics and measurement are DALIAN XINGUAN TECH CO LTD, Hefei huada semiconductor co ltd and YESPOWERTECHNIX CO LTD.

Patent filings in countries

World map showing YEST CO LTDs patent filings in countries

Patent filings per year

Chart showing YEST CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yeo Won Jae 30
#2 Ham Young Joon 24
#3 Kim Jeong Eui 14
#4 Lim Jong Chan 13
#5 Shu Min Suke 12
#6 Baik Tae Hyun 11
#7 Kim Sang Doo 11
#8 Kim Tae Kyung 9
#9 Choi Jae Woon 8
#10 Si Sung Su 8

Latest patents

Publication Filing date Title
KR102154475B1 Dual chamber apparatus for semiconductor device
KR20200063977A EFEM, Equipment Front End Module
KR102227596B1 Apparatus for heat treatment to glass
KR102176396B1 Chamber apparatus for process
KR20200132057A Chamber apparatus for process
KR20200129541A Apparatus for laminating film sheet
KR102143351B1 Cooling system including fire-fighting function
KR20200043762A A test device for semiconductor
KR20200043763A A test device for semiconductor
KR20200034515A Local ventilation unit and heat treatment apparatus including the same
KR20200034514A Heat treatment apparatus
KR20200034512A Heat treatment apparatus
KR20200034513A Supprot unit for heat treatment apparatus
KR20200034511A Chamber unit and heat treatment apparatus including the same
KR101989248B1 A device, a method and a system for cleaning mask
KR20190048380A Chamber for Processing a Semi-conductor Substrate
KR20190048381A Chamber for Processing a Semi-conductor Substrate
KR20190012792A A method and system for dicing wafer
KR20190012763A A method and system for dicing wafer
KR20190010820A Apparatus for testing semiconductor component