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YAMADA DENON KK

Overview
  • Total Patents
    24
  • GoodIP Patent Rank
    233,946
About

YAMADA DENON KK has a total of 24 patent applications. Its first patent ever was published in 1986. It filed its patents most often in Japan. Its main competitors in its focus markets semiconductors are MRD KK, HONGBIN ZHANG and 45TH RES INST OF CHINA ELECTRO.

Patent filings in countries

World map showing YAMADA DENON KKs patent filings in countries
# Country Total Patents
#1 Japan 24

Patent filings per year

Chart showing YAMADA DENON KKs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Semiconductors

Focus technologies

# Technology
#1 Semiconductor devices

Top inventors

# Name Total Patents
#1 Matsui Hideo 14
#2 Yamagami Hiroshi 2
#3 Yamada Yuji 2
#4 Nakao Tetsuro 2
#5 Yamamoto Isamu 1
#6 Shiozaki Takashi 1
#7 Yamada Shuzo 1
#8 Yashima Takeshi 1
#9 Tsujimoto Yoichi 1
#10 Irie Akisuke 1

Latest patents

Publication Filing date Title
JP2018036221A Reliability test board using ic tray for device transportation
JP2011237446A Method for collectively moving ic
JP2012044077A Positioning and fixing mechanism of semiconductor device in labeling machine or laser marking
JP2011222162A Highly reliable structure for connection with semiconductor device
JP2010243384A Skew stable circuit of semiconductor evaluation device using dll function of fpga
JP2010243382A Highly reliable contact structure
JP2010245214A Connection structure of bga package for semiconductor device
JP2010243265A Tray-system electric signal and power supply test board
JP2009036735A Burn-in system using micro probe pin
JP2008304196A Connecting structure to semiconductor device
JP2008096257A Microprobe pin
JP2008034316A Multiple pin connector to which unnecessary pressure is not applied
JP2007309787A High-throughput handler batch-processing mechanism
JP2007225526A Electric signal and power source supply testing substrate
JP2007227108A Board utilization type ic socket
JP2000346910A Measuring device for parallelly and simultaneously testing a large number of ics
JP2000068428A Plate for making temperature of lsi uniform
JP2000067722A Relay selection circuit
JP2000039461A Measuring method for junction temperature of semiconductor integrated circuit and dut board using the measuring method
JPH02214215A Continuously variable frequency oscillating circuit