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PINA BOHUMIL

Overview
  • Total Patents
    17
About

PINA BOHUMIL has a total of 17 patent applications. Its first patent ever was published in 1977. It filed its patents most often in Czechoslovakia. Its main competitors in its focus markets semiconductors are INFINEON TECHNOLOGIES BIPOLAR GMBH & CO KG, LAIBAO SCI & TECH CO LTD and REXCHIP ELECTRONICS CORP.

Patent filings in countries

World map showing PINA BOHUMILs patent filings in countries
# Country Total Patents
#1 Czechoslovakia 17

Patent filings per year

Chart showing PINA BOHUMILs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Semiconductors

Focus technologies

# Technology
#1 Semiconductor devices

Top inventors

# Name Total Patents
#1 Pina Bohumil 13
#2 Homola Jaroslav 10
#3 Satek Jaroslav 5
#4 Kalenda Libor 5
#5 Hartman Jan 4
#6 Pina Bohumil Ing 4
#7 Zamastil Jaroslav Rndr 4
#8 Homola Jaroslav Rndr 3
#9 Zamastil Jaroslav 3
#10 Wedell Martin Rndr 2

Latest patents

Publication Filing date Title
CS802088A1 Contact board with equalizing resistors of high-duty semiconductor structures' articulated emitters
CS833487A1 High-power semi-conductor component
CS430887A1 Method of high-duty potentialless semiconductor module production
CS408487A1 High-power hybrid potential-free semi-conductor module
CS248539B1 High-duty semiconductor device
CS247842B1 Method of semiconductor devices production on extremely thin monocrystalline semiconductor boards
CS248345B1 High-duty semiconductor device
CS896384A1 Method of high-resistance layer production on a low-resistance semiconductor substrate
CS246844B1 Production method of passivating layer on the surface ofhigh-voltage pn transition
CS167484A1 Device for centring of semiconductor system
CS436383A1 Checking method of impurities level of semiconductors plates
CS319583A1 Semiconductor power diode with high carrying capacity in closing
CS232897B1 Light-controlled semiconductor power component
CS222383A1 Power semiconductor element controlled by light
CS237588B1 Interlayer from soft metal for large-surface contacts especially of power semiconductor devices
CS220681B1 Method of control of the quality of metal-semiconductor-metal contact
CS192827B1 Multilayer semiconductor element