| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 3 | |
| #2 | France | 3 | |
| #3 | United States | 2 | |
| #4 | WIPO (World Intellectual Property Organization) | 2 | |
| #5 | Japan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Micro-structure and nano-technology |
| # | Technology | |
|---|---|---|
| #1 | Scanning-probe techniques | |
| #2 | Measuring speed and acceleration | |
| #3 | Microstructural devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Faucher Marc | 10 |
| #2 | Walter Benjamin | 10 |
| #3 | Mairiaux-Mage Estelle | 3 |
| #4 | Mairiaux Estelle | 2 |
| #5 | Benjamin Walter | 1 |
| #6 | Marc Faucher | 1 |
| Publication | Filing date | Title |
|---|---|---|
| FR3057958A1 | MINIATURIZED ATOMIC FORCE MICROSCOPY PROBE WITH LOW DIMENSIONS | |
| US2017113918A1 | Microelectromechanical device and system with low-impedance resistive transducer | |
| FR3055011A1 | Micromechanical sensor with optical transduction | |
| EP3325981A1 | Compact probe for atomic-force microscopy and atomic-force microscope including such a probe |