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VLSI STANDARDS INC

Overview
  • Total Patents
    21
About

VLSI STANDARDS INC has a total of 21 patent applications. Its first patent ever was published in 1987. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Japan. Its main competitors in its focus markets measurement, semiconductors and surface technology and coating are CANDELA INSTR, IMS MESSSYSTEME GMBH and UNIVERSAL KIKI KK.

Patent filings in countries

World map showing VLSI STANDARDS INCs patent filings in countries

Patent filings per year

Chart showing VLSI STANDARDS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Scheer Bradley W 16
#2 Greed Jr James J 4
#3 Laird Ellen R 4
#4 Konicek Paul A 3
#5 Bullis W Murray 3
#6 Stover John C 2
#7 Bradley W Scheer 2
#8 Prochazka J Jerry 2
#9 Monteverde Robert J 2
#10 Scheer Craig A 2

Latest patents

Publication Filing date Title
US6358860B1 Line width calibration standard manufacturing and certifying method
US6016684A Certification of an atomic-level step-height standard and instrument calibration with such standards
US5955654A Calibration standard for microroughness measuring instruments
US5659388A Method and apparatus for operating a condensation nucleus counter with improved counting stability and accuracy over a variable detection threshold
US5599464A Formation of atomic scale vertical features for topographic instrument calibration
US5453830A Spatially isolated diffractor on a calibration substrate for a pellicle inspection system
KR100209453B1 System and method for accurately depositing particles on a surface
US5194297A System and method for accurately depositing particles on a surface
JPH06283593A Reference device for optical surface scanner of linear-scanning beam type
US5078492A Test wafer for an optical scanner
US5198869A Reference wafer for haze calibration
US4725294A Apparatus for collection of particulate matter from an ambient gas