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US4229652A
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Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material
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US4190770A
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Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material
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Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material
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Thickness measurement instrument with memory storage of multiple calibrations
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US4046994A
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Control card receiving and sensing assembly
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Card controlled beta backscatter thickness measuring instrument
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US4042880A
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Electrode assembly for measuring the effective thickness of thru-hole plating circuit board workpieces
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US3885215A
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Electrode assembly for measuring the effective thickness of thru-hole plating in circuit board workpieces or the like
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US3786686A
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Supporting device
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US3766470A
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Apparatus for testing the integrity of a thru-hole plating in circuit board workpieces or the like by measuring the effective thickness thereof
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US3720833A
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Radiation backscatter measuring instrument
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US3588507A
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Beta backscatter thickness measuring apparatus for apertures in printed circuit boards and the like
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US3560742A
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Portable beta backscatter measuring instrument assembly
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US3519824A
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Guide for probe assembly of portable radiation backscatter measuring instrument
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US3496359A
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Portable beta backscatter type measuring instrument
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Workpiece support and mask assemblies for radiation backscatter measuring instruments
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US3421000A
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Workpiece support and mask assemblies for radiation backscatter measuring instruments
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US3271572A
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Direct reading beta ray comparator
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US2933677A
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Probe for a thickness testing gage
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