Learn more

UEMURA KOGYO KK

Overview
  • Total Patents
    636
  • GoodIP Patent Rank
    7,164
  • Filing trend
    ⇩ 2.0%
About

UEMURA KOGYO KK has a total of 636 patent applications. It decreased the IP activity by 2.0%. Its first patent ever was published in 1971. It filed its patents most often in Japan, United States and Republic of Korea. Its main competitors in its focus markets surface technology and coating, audio-visual technology and semiconductors are C UYEMURA & CO LTD, ELECTROPLATING ENG OF JAPAN LTD and EBARA UDYLITE KK.

Patent filings per year

Chart showing UEMURA KOGYO KKs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kiso Masayuki 54
#2 Tanabe Katsuhisa 46
#3 Yamamoto Hisamitsu 43
#4 Araki Ken 39
#5 Uchida Hiroki 38
#6 Kubo Mitsuyasu 35
#7 Matsumoto Hiroshi 35
#8 Matsumura Muneyori 35
#9 Kubo Motonobu 31
#10 Utsumi Masayuki 31

Latest patents

Publication Filing date Title
US2021102295A1 Surface Treatment Device, Surface Treatment Method And Paddle
US2021102306A1 Holding apparatus
WO2021024599A1 Pretreatment method for electroless plating, and pretreatment solution for electroless plating
KR20210010469A Electroless copper plating bath
JP2020193365A Method for manufacturing printed circuit board
JP2020172683A Gold plating method and plated film
JP2020143332A Electroless gold plating bath
WO2019163665A1 Electroless palladium plating solution and palladium coating
JP2020117763A Work-holding jig and electroplating device
JP2020117765A Work-holding jig and electroplating device
JP2020117764A Work-holding jig and electroplating device
JP2020111781A Surface treatment apparatus
JP2020111780A Apparatus and method of surface treatment
JP2020084301A Electroless plating bath
JP2020084264A Holding tool
JP2020063477A Electrolytic Sn alloy plating solution
JP2018199869A Surface treatment apparatus
JP2020050886A ELECTROLYSIS Sn PLATING SOLUTION
JP2020009997A Conductive bump, and electroless platinum plating bath
KR20200035403A Fluorescence X-ray analysis measurement method and fluorescence X-ray analysis measurement device