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DE102019000164A1
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Lateral one-time programmable memory device
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DE102016013564B3
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Method for controlling the quality of integrated components
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Conveying device and method for transporting an object
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measuring system
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DE102016009166A1
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measuring system
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Method for calculating the phase shift or amplitude of a three-phase system
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DE102016107808A1
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Method and arrangement for monitoring a condition
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DE102016002487B3
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Positioning sensor unit
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DE102016002488B3
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Position Determination Entity
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DE102016100366A1
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Adapter for receiving an integrated circuit
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DE102015122109A1
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Voltage-resistant switch
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DE102015015350A1
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Magnetic field detector circuit and method of operating a magnetic field detector circuit
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DE102015014952A1
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Method for dynamic noise suppression of magnetic field sensor signals and magnetic field sensor circuit with a dynamic noise suppression
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EP2985796A1
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Component with reduced tension forces in the substrate
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DE102014008840A1
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Arrangement for testing integrated circuits
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DE102014003962A1
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Method for testing a CMOS transistor
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DE102014003408A1
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Measuring device for determining an angular position
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DE102013020578A1
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measuring system
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DE102012020515A1
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Current sensor and method for detecting a de-energized state
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DE102012007899A1
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voltage regulators
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