| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Japan | 9 | |
| #2 | United States | 5 |
| # | Industry | |
|---|---|---|
| #1 | Semiconductors | |
| #2 | Measurement | |
| #3 | Electrical machinery and energy |
| # | Technology | |
|---|---|---|
| #1 | Semiconductor devices | |
| #2 | Measuring electric variables | |
| #3 | Electrically-conductive connections |
| # | Name | Total Patents |
|---|---|---|
| #1 | Hasegawa Yoshiei | 14 |
| #2 | Masuda Hikaru | 2 |
| #3 | Hasegawa Masashi | 2 |
| #4 | Washio Kenichi | 2 |
| #5 | Yasuda Katsuo | 2 |
| Publication | Filing date | Title |
|---|---|---|
| US4563640A | Fixed probe board | |
| JPS57113243A | Stationary probe board | |
| JPS57113244A | Inspecting device of wafer surface | |
| JPS5766649A | Automatic measuring device for semiconductor wafer | |
| JPS56135938A | Fixed probe board | |
| JPS56105647A | Probeboard | |
| JPS5612744A | Wafer prober | |
| JPS568837A | Probe needle | |
| JPS55133550A | Probe needle | |
| JPS55133549A | Probe card |