| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 12 |
| # | Industry | |
|---|---|---|
| #1 | Computer technology | |
| #2 | Semiconductors | |
| #3 | Telecommunications | |
| #4 | Digital networks | |
| #5 | Measurement |
| # | Name | Total Patents |
|---|---|---|
| #1 | Tailliet Francois | 12 |
| #2 | Battista Marc | 1 |
| #3 | Bahout Yvon | 1 |
| #4 | Wuidart Luc | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US2013064015A1 | Method of burn-in test of EEPROM or flash memories | |
| US2012250429A1 | Security-protection of a wafer of electronic circuits |