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SUNIC SYSTEM LTD

Overview
  • Total Patents
    628
  • GoodIP Patent Rank
    3,793
  • Filing trend
    ⇧ 5.0%
About

SUNIC SYSTEM LTD has a total of 628 patent applications. It increased the IP activity by 5.0%. Its first patent ever was published in 2000. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets semiconductors, surface technology and coating and electrical machinery and energy are EUGENUS INC, GENITECH CO LTD and FINEVA INC.

Patent filings in countries

World map showing SUNIC SYSTEM LTDs patent filings in countries

Patent filings per year

Chart showing SUNIC SYSTEM LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hwang In Ho 73
#2 Lee Young Jong 48
#3 Lee Jae Ho 35
#4 Seo Tae Won 35
#5 Kim Su Yeon 35
#6 Choi Chang Sik 34
#7 Sung Gi Hyun 34
#8 Kim Sun Hyuk 32
#9 Kim Hyung Mok 31
#10 Choi Jae Soo 31

Latest patents

Publication Filing date Title
KR20210033564A Substrate supporting structure
KR20210033565A Substrate inducing holder
KR102165032B1 Substrate alignment apparatus and thin film deposition system including the same
KR20210009204A Cluster type deposition equipment
KR20210007205A Evaporation source
KR20210006053A Apparatus for separating crucible nozzle cap
KR20210001040A Crucible for point evaporation source and point evaporation source having the same
KR20210001041A Reflector for deposition source and deposition source having the same
KR20200144325A Evaporation source
KR20200143954A Baking device of heater for evaporation source
KR20200136135A Apparatus for Preventing Deflection of Shutter in Feeder
KR20200134531A Crucible Member Having Heat Shield
KR20200132207A Sensor pollution prevention shield and apparatus for measuring thickness of deposited film having shield
KR20200132208A Signal Spring Connector for Connecting Carousel
KR20200132206A Planarizer for crucible for evaporation source
KR20200129923A wafer size expanding unit and wafer alignment apparatus including the same
KR20200129285A Sensor alignment apparatus and deposition apparatus including the same
KR20200125289A Evaporation source
KR20200125290A Deposition material monitoring apparatus
KR20200125285A Tamping Jig for Measuring Deposition Material and Apparatus for Measuring Deposition Material Having the Same