| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Germany | 4 | |
| #2 | WIPO (World Intellectual Property Organization) | 3 | |
| #3 | EPO (European Patent Office) | 2 | |
| #4 | United States | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Audio-visual technology | |
| #3 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Special information storage | |
| #3 | Measuring light | |
| #4 | Measuring length, angles and areas | |
| #5 | Image data processing |
| # | Name | Total Patents |
|---|---|---|
| #1 | Kubitzek Ruediger | 6 |
| #2 | Hertling Rolf | 4 |
| #3 | Bergmann Andreas | 1 |
| Publication | Filing date | Title |
|---|---|---|
| DE10103163A1 | measuring device | |
| DE10054099A1 | Method and apparatus for determining defects on or in an object | |
| DE10017461A1 | Evaluation of digital image data is based upon generation of grey image values | |
| DE19950559A1 | Method for determining geometric structures on or in a substrate and material parameters |