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BYK GARDNER GMBH

Overview
  • Total Patents
    160
  • GoodIP Patent Rank
    103,664
  • Filing trend
    ⇧ 200.0%
About

BYK GARDNER GMBH has a total of 160 patent applications. It increased the IP activity by 200.0%. Its first patent ever was published in 1989. It filed its patents most often in Japan, Germany and United States. Its main competitors in its focus markets measurement, computer technology and semiconductors are RAINTREE SCIENT INSTR SHANGHAI, JORDAN VALLEY SEMICONDUCTORS and NEO MONITORS AS.

Patent filings in countries

World map showing BYK GARDNER GMBHs patent filings in countries

Patent filings per year

Chart showing BYK GARDNER GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Schwarz Peter 66
#2 Sperling Uwe 54
#3 Lex Konrad 43
#4 Schwartz Peter 28
#5 Konrad Lex 8
#6 Peter Schwarz 7
#7 Hentschel Gerhard 5
#8 Wimmer Severin 4
#9 Uwe Sperling 3
#10 Zellner Ralf 2

Latest patents

Publication Filing date Title
DE102017211067A1 Receiving device for a surface measuring device
DE102014108789A1 Multi-stage process for the examination of surfaces and corresponding device
DE102014103640A1 Apparatus and method for examining surface properties
DE102014100774A1 Device for calibrating optical measuring devices
DE102011053140A1 Apparatus and method for measuring optical properties of transparent materials
DE102011108599A1 Apparatus and method for the examination of coatings with effect pigments
DE102010032600A1 Apparatus and method for the determination of surface properties with multiple measurement
DE102009033098A1 Method and device for determining properties of structured surfaces
DE102009033110A1 Device for examining structured surfaces
DE102008051513A1 Surface measuring device with two measuring units
JP2008256684A Method and apparatus for quantitative determination of surface property
DE102008013387A1 Device for determining the optical surface properties of workpieces
DE102007053574A1 colorimeter
US2008013075A1 Determining surface properties with angle offset correction
DE102007014475A1 Method for determining surface properties, involves evaluating locally resolved sketch of surface to be examined with multiple measured values, where sketch represents certain physical properties that are characterized by measured values
DE102007014474A1 Method for quantitative determination of surface characteristics, involves evaluating local resolution image of surface that is examined
DE102006048688A1 Method and device for the examination of surfaces with effect pigments
DE102006045285A1 Device for the investigation of surface properties with indirect lighting
DE102006037681A1 Apparatus and method for the topographic determination of surface properties
DE102006032404A1 Apparatus and method for determining surface properties