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SK SILTRON CO LTD

Overview
  • Total Patents
    369
  • GoodIP Patent Rank
    4,086
  • Filing trend
    ⇩ 23.0%
About

SK SILTRON CO LTD has a total of 369 patent applications. It decreased the IP activity by 23.0%. Its first patent ever was published in 2009. It filed its patents most often in Republic of Korea, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets semiconductors, surface technology and coating and machine tools are SHINETSU HANDOTAI KK, ZING SEMICONDUCTOR CORP and SUMCO CORP.

Patent filings per year

Chart showing SK SILTRON CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Park Hyun Woo 15
#2 Kang In Gu 14
#3 Lee Jae Hyeong 13
#4 Kim Woo Tae 12
#5 Kim Ja Young 12
#6 Choi Il Soo 11
#7 Song Do Won 11
#8 Kim Cheol Soo 10
#9 Lee Woo Sung 9
#10 Ham Ho Chan 9

Latest patents

Publication Filing date Title
WO2021080094A1 Raw material supply unit, single crystal silicon ingot growing apparatus comprising same and raw material supply method
WO2021080093A1 Raw material supply unit, and apparatus comprising same for growing single-crystal silicon ingot
WO2021066242A1 Wafer polishing head, method for manufacturing wafer polishing head, and wafer polishing apparatus comprising same
KR20210026763A Paddle device and Polishing device
KR20210025825A Wafer mounting device and operating method thereof
KR20210023134A Wafer polishing pad manufacturing apparatus and method for manufacturing a wafer polishing pad using the same
KR20210022263A Wafer cleaning apparatus and cleaning method thereof
KR20210020539A Apparatus for removing suspended solids to grow single crystal ingots, single crystal ingot grower applying the apparatus and method thereof
KR20210020355A Manufacturing method of susceptor for wafer
KR20210020340A Flexible substrate cleaning apparatus
KR20210014956A Method for measuring defect of silicon wafer and wafer
KR20210014953A Crucible for ingot grower
KR20210014963A Method for analyzing contamination at surface of wafer
KR20210014340A Method for setting growth temperature of epitaxial layer of wafer and method for growing epitaxial layer
KR20210011147A Wafer Lapping Apparatus
KR20210011145A Driving unit measuring apparatus and silicon single crystal growing apparatus having same
KR20210011132A Poly silicon material dust Removal Apparatus
KR20210006104A Block stocker and Wafer mounting apparatus having the same
KR20200142233A Wafer Inspection Apparatus
KR20200131507A Apparatus for semiconductor substrate cleaning and semiconductor substrate cleaning method using it