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SIONYX INC

Overview
  • Total Patents
    74
  • GoodIP Patent Rank
    149,869
About

SIONYX INC has a total of 74 patent applications. Its first patent ever was published in 2008. It filed its patents most often in WIPO (World Intellectual Property Organization), United States and China. Its main competitors in its focus markets semiconductors, environmental technology and audio-visual technology are IKEDA OSAMU, ISETEX INC and RHODES HOWARD E.

Patent filings per year

Chart showing SIONYX INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Haddad Homayoon 21
#2 Jiang Jutao 17
#3 Carey James 15
#4 Pralle Martin U 13
#5 Mckee Jeffrey 13
#6 Carey James E 11
#7 Sickler Jason 9
#8 Vineis Christopher 9
#9 Forbes Leonard 8
#10 Saylor Stephen D 8

Latest patents

Publication Filing date Title
US2014191354A1 Laser system with polarized oblique incidence angle and associated methods
US2014307059A1 Three dimensional imaging utilizing stacked imager devices and associated methods
KR20150130303A High dynamic range cmos image sensor having anti-blooming properties and associated methods
KR20150129675A Biometric imaging devices and associated methods
US2015014803A1 Shallow trench textured regions and associated methods
CN110911431A Shallow trench textured areas and related methods
US8674316B1 Electromagnetic radiation imaging devices and associated methods
US2014152844A1 Black level calibration methods for image sensors
US2014154891A1 Beam Delivery Systems for Laser Processing Materials and Associated Methods
US2014138785A1 Pixel isolation elements, devices, and associated methods
WO2013120093A1 Low damage laser-textured devices and associated methods
US2013207214A1 Integrated visible and infrared imager devices and associated methods
US2013168792A1 Three Dimensional Architecture Semiconductor Devices and Associated Methods
WO2013056249A1 Three dimensional architecture semiconductor devices and associated methods
US2013168826A1 Laser system with polarized oblique incidence angle and associated methods
CN103946867A Biometric imaging devices and associated methods
US2013001729A1 High Fill-Factor Laser-Treated Semiconductor Device on Bulk Material with Single Side Contact Scheme
CN106158895A Three-dimension sensor, system and relevant method
CN105679862A Semiconductor devices having reduced substrate damage and associated methods
WO2012088338A2 Photodetecting imager devices having correlated double sampling and associated methods