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SHANGHAI RES INST MICROELECTRONICS SHRIME PEKING UNIV

Overview
  • Total Patents
    54
  • GoodIP Patent Rank
    65,274
About

SHANGHAI RES INST MICROELECTRONICS SHRIME PEKING UNIV has a total of 54 patent applications. Its first patent ever was published in 2008. It filed its patents most often in China. Its main competitors in its focus markets semiconductors, environmental technology and electrical machinery and energy are YANGZHOU HY TECHNOLOGY DEV CO LTD, HATA MASAHIKO and HAT TEKNOLOJI A S.

Patent filings in countries

World map showing SHANGHAI RES INST MICROELECTRONICS SHRIME PEKING UNIVs patent filings in countries
# Country Total Patents
#1 China 54

Patent filings per year

Chart showing SHANGHAI RES INST MICROELECTRONICS SHRIME PEKING UNIVs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chengyuhua 31
#2 Xu Fan 22
#3 Zhang Jiong 13
#4 Jiang Lele 9
#5 Yuhua Cheng 7
#6 Cheng Yuhua 6
#7 Zheng Ruotong 5
#8 Lu Yu 4
#9 Xiong Tao 4
#10 Liu Shaolong 3

Latest patents

Publication Filing date Title
CN104167492A Perovskite battery and preparation method thereof
CN104091692A Solar cell with high conversion efficiency and preparation method thereof
CN105097925A Novel power device structure
CN105095550A Parameterization unit for improving device matching features
CN105097788A Novel inductor structure and implementation method
CN105097923A Double-buried layer SOI high-voltage device
CN105097926A Novel radio-frequency transistor layout structure
CN105095547A Parameterized unit for improving device matching characteristic
CN105095548A Parameterization unit for improving matching property of device
CN105097642A Device structure capable of improving SOI heat-radiation characteristic
CN105093004A Antistatic testing system protecting circuit
CN105097922A Structure of SOI power LDMOS field effect transistor and manufacturing method thereof
CN105097732A SOI high-voltage structure for reducing self-heating effect
CN105097927A New device structure improving breakdown voltage of SOI device
CN105097928A SOI device new structure
CN105093003A Method for testing characteristic representing crosstalk between high voltage and low voltage
CN105093087A ESD characteristic test system
CN105097924A Power device structure
CN105097920A SOI high-voltage device provided with stepped shielding groove voltage-resisting structure and double-drain-electrode structure
CN105097921A VDMOS transistor structure and fabricating method thereof