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SHANGHAI HUALING INTEGRATED CIRCUIT TECHNOLOGY CO LTD

Overview
  • Total Patents
    46
  • GoodIP Patent Rank
    79,867
About

SHANGHAI HUALING INTEGRATED CIRCUIT TECHNOLOGY CO LTD has a total of 46 patent applications. Its first patent ever was published in 2009. It filed its patents most often in China. Its main competitors in its focus markets semiconductors, computer technology and measurement are TOHOKU SEIKI IND, KANKYO DENJI GIJUTSU KENKYUSHO and SECRON CO LTD.

Patent filings in countries

World map showing SHANGHAI HUALING INTEGRATED CIRCUIT TECHNOLOGY CO LTDs patent filings in countries
# Country Total Patents
#1 China 46

Patent filings per year

Chart showing SHANGHAI HUALING INTEGRATED CIRCUIT TECHNOLOGY CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Qi Jianhua 21
#2 Zhang Zhiyong 16
#3 Hao Dandan 15
#4 Tang Xuefei 13
#5 Yu Kun 13
#6 Liu Yuanhua 13
#7 Ye Shouyin 13
#8 Xu Hui 13
#9 Niu Yong 12
#10 Wang Jin 12

Latest patents

Publication Filing date Title
CN105277755A Cantilever type probe system
CN104880609A Method for measuring parasitic capacitance of circuit through ATE
CN104952756A Test device and test system for three-dimensional packaging base plate
CN104734710A Test system for ADC chip characteristic parameter test precision
CN104660256A Method for measuring locking time of phase-locked loop
CN104637541A Test method of storage device
CN104656008A Real-time signal compensation method
CN104701206A Three-dimensional packaging chip silicon through hole testing device
CN104678290A Test method with multiple test procedures
CN104656009A Method for storing test vectors in test machine
CN104678289A Method for calibrating setting values and measurement values in shmoo test
CN104618188A IEEE 1149.1 protocol based testing method adopted in packaging process
CN104569791A Nondestructive testing structure for IP (intelligent property) hard cores and method for implementing nondestructive testing structure
CN104678287A Chip UID (User Identification) mapping writing-in method
CN104599995A Method for offline positioning of continuous bad points of image sensing chip
CN104597392A Data depth traceability test method
CN104535807A Light source structure
CN104484885A ATE test method for CIS chip YUV format output
CN104459231A Multi-temperature-zone wafer test probe card
CN104316731A Chip test board and chip test system