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SCREEN SEMICONDUCTOR SOLUTIONS CO LTD

Overview
  • Total Patents
    68
  • GoodIP Patent Rank
    52,526
  • Filing trend
    ⇧ 50.0%
About

SCREEN SEMICONDUCTOR SOLUTIONS CO LTD has a total of 68 patent applications. It increased the IP activity by 50.0%. Its first patent ever was published in 2007. It filed its patents most often in Taiwan, Japan and United States. Its main competitors in its focus markets semiconductors, surface technology and coating and optics are SOKUDO CO LTD, SOKUDO KK and KINGSEMI CO LTD.

Patent filings in countries

World map showing SCREEN SEMICONDUCTOR SOLUTIONS CO LTDs patent filings in countries
# Country Total Patents
#1 Taiwan 35
#2 Japan 17
#3 United States 15
#4 EPO (European Patent Office) 1

Patent filings per year

Chart showing SCREEN SEMICONDUCTOR SOLUTIONS CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kawamatsu Yasuo 21
#2 Ogura Hiroyuki 16
#3 Mitsuhashi Tsuyoshi 13
#4 Nagashima Hiromichi 11
#5 Morinishi Kenya 11
#6 Fukutomi Yoshiteru 11
#7 Inagaki Yukihiko 10
#8 Nishimura Kazuhiro 10
#9 Miyagi Tadashi 7
#10 Harumoto Masahiko 7

Latest patents

Publication Filing date Title
JP2018160681A Substrate processing method
JP2017098581A Heating plate cooling method
JP2017063222A Substrate processing device and substrate processing method
JP2017069570A Substrate processing method
JP2016139828A Substrate processing apparatus
JP2016106432A Substrate processing method
JP2016103024A Substrate treatment method and substrate treatment device
JP2015173272A substrate processing method
JP2015111685A Substrate processing method and substrate processing apparatus
JP2015099925A Development method
JP2015057861A Substrate processing apparatus
JP2015039019A Substrate processing equipment
JP2015195303A Wafer processing apparatus
JP2014236145A Thermal treatment apparatus and heating plate cooling method
JP2014236084A Analytical method, analyzer and substrate processing apparatus
JP2014236083A Substrate processing apparatus, transfer method of substrate for temperature measurement, and testing method
JP2014236082A Test schedule creation method, testing method, test schedule creation device, and substrate processing device
TW201351070A Development processing device