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SAKI CORP KK

Overview
  • Total Patents
    67
  • GoodIP Patent Rank
    142,727
  • Filing trend
    ⇩ 60.0%
About

SAKI CORP KK has a total of 67 patent applications. It decreased the IP activity by 60.0%. Its first patent ever was published in 1995. It filed its patents most often in Japan. Its main competitors in its focus markets measurement, audio-visual technology and computer technology are MACHVISION INC, EICKHORST MANFRED and ZHEJIANG TRACETECH TECH CO LTD.

Patent filings in countries

World map showing SAKI CORP KKs patent filings in countries
# Country Total Patents
#1 Japan 67

Patent filings per year

Chart showing SAKI CORP KKs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Akiyama Yoshihiro 49
#2 Akiyama Sakie 6
#3 Hirayama Takuma 5
#4 Yagizume Kenji 4
#5 Suzuki Yosuke 4
#6 Tanaka Hideaki 4
#7 Ota Masayuki 3
#8 Ueda Takushi 3
#9 Iwano Yukio 2
#10 Onodera Ken 2

Latest patents

Publication Filing date Title
JP2021009057A Shape measuring device, shape measurement method of shape measuring device, and shape measurement program of shape measuring device
JP2019124543A Method for acquiring inspection device height information and inspection device
JP2019124544A Inspection device adjustment method and inspection device
JP2019090647A Method for determining position of liquid crystal display element in projection unit of inspection device
JP2019086483A Method for acquiring height information on inspection device and inspection device
JP2019060808A Method for specifying inspection position and inspection device
JP2019060809A Method for generating three-dimensional image and inspection device
JP2018179665A Inspection method and inspection device
JP2018017608A Method and device for inspecting circuit board
JP2015219162A Inspection device
JP2015219035A Inspection device
JP2015206752A Inspection device
JP2015096816A Inspection apparatus
JP2012053016A Visual inspection device and visual inspection method
JP2012053015A Visual inspection device and visual inspection method
JP2011149738A Method of correcting inspection device using tool for correction and inspection device mounted with tool for correction
JP2011149736A Appearance inspection apparatus and appearance inspection method
JP2011149737A Inspection device
JP2011095227A Radiation inspection device of inspection object
JP2011095226A Inspection device of material to be inspected, and position correction device of electronic substrate