Learn more

S&S TECH CO LTD

Overview
  • Total Patents
    329
  • GoodIP Patent Rank
    9,659
  • Filing trend
    ⇧ 227.0%
About

S&S TECH CO LTD has a total of 329 patent applications. It increased the IP activity by 227.0%. Its first patent ever was published in 2002. It filed its patents most often in Republic of Korea, Taiwan and United States. Its main competitors in its focus markets optics, semiconductors and surface technology and coating are SHIRASAKI TORU, TANABE MASARU and EBIHARA AKIMITSU.

Patent filings per year

Chart showing S&S TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Nam Kee Soo 221
#2 Shin Cheol 115
#3 Yang Chul Kyu 95
#4 Cha Han Sun 84
#5 Lee Jong Hwa 81
#6 Nam Kee-Soo 76
#7 Yang Chul-Kyu 58
#8 Yang Sin Ju 58
#9 Lee Jong-Hwa 50
#10 Kang Geung Won 36

Latest patents

Publication Filing date Title
KR20210031664A Pellicle with a wrinkle on a plane thereof
US2021124254A1 Half-tone attenuated phase shift blankmask and photomask for euv lithography
WO2021080294A1 Pellicle for extreme ultraviolet lithography using boron nitride nanotube and method for producing same
JP2020197704A Blankmask and photomask
KR20210007807A Reflective type Blankmask for EUV, and Method for manufacturing the same
KR20210023650A Half-tone Blankmask and Photomask fabricated with the same
KR20210022479A Blankmask for EUV, and Photomask manufactured with the same
EP3798728A1 Pellicle for euv lithography and method for manufacturing the same
WO2020138855A1 Blank mask and photomask
KR20200137938A Blankmask, photomask and method for fabricating of the same
KR20200141913A Pellicle with improved wrinkle, and method for manufacturing the same
KR20210015157A Blankmask and photomask for the Flat Panel Display
KR20190128604A Phase Shift Blankmask and Photomask
KR20200126084A Blankmask, photomask and method for fabricating of the same
KR20200126216A Pellicle for Extreme Ultraviolet(EUV) Lithography and method for fabricating of the same
KR20190107604A Pellicle for Extreme Ultraviolet(EUV) Lithography and Method for fabricating the same
KR20190107603A Pellicle for Extreme Ultraviolet(EUV) Lithography and Method for fabricating the same
KR20200121044A Phase Shift Blankmask and Photomask
KR20200113553A Phase Shift Blankmask and Photomask
KR20200109574A Gray tone Blank mask and Photo mask