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BRUKER AXS INC

Overview
  • Total Patents
    86
  • GoodIP Patent Rank
    43,508
  • Filing trend
    ⇧ 75.0%
About

BRUKER AXS INC has a total of 86 patent applications. It increased the IP activity by 75.0%. Its first patent ever was published in 1999. It filed its patents most often in United States, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, electrical machinery and energy and computer technology are RIGAKU DENKI KOGYO KK, RAE SYSTEMS INC and RIGAKU DENKI CO LTD.

Patent filings in countries

World map showing BRUKER AXS INCs patent filings in countries

Patent filings per year

Chart showing BRUKER AXS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Durst Roger D 23
#2 He Bob Baoping 20
#3 Kaercher Joerg 17
#4 Giencke Jonathan 10
#5 He Bob Boaping 8
#6 Durst Roger 7
#7 Seijbel Leendert J 6
#8 Wachter Gregory A 5
#9 Bollig Ryan C 5
#10 Wachter Gregory 5

Latest patents

Publication Filing date Title
WO2020209868A1 A system and method for diffraction-based structure determination with simultaneous processing modules
US2019056514A1 Indirect photon-counting analytical X-ray detector
US2020033275A1 Divergent beam two dimensional diffraction
US2018372658A1 X-ray diffraction device and method to measure stress with 2D detector and single sample tilt
US2018292334A1 Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector
US2017343490A1 Two-dimensional X-ray detector position calibration and correction with diffraction pattern
US2017176355A1 Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector
US2015369929A1 X-ray detector operable in a mixed photon-counting/analog output mode
US2015346121A1 Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector
US2015276629A1 Method of conducting an X-ray diffraction-based crystallography analysis
US2015103980A1 X-ray diffraction based crystal centering method using an active pixel array sensor in rolling shutter mode
US2015016594A1 X-ray diffraction-based defective pixel correction method using an active pixel array sensor
US2014264046A1 One-dimensional x-ray detector with curved readout strips
US2014192959A1 Method and apparatus for surface mapping using in-plane grazing incidence diffraction
EP2773949A1 Multiply-sampled cmos sensor for x-ray diffraction measurements with corrections for non-ideal sensor behavior
CN103930773A Method for correcting timing skew in X-ray data read out of X-ray detector in rolling shutter mode
EP2564186A2 Method and apparatus for using an area x-ray detector as a point detector in an x-ray diffractometer
US7885383B1 Method for measuring crystallite size with a two-dimensional X-ray diffractometer
US7660389B1 Sample alignment mechanism for X-ray diffraction instrumentation
US7928400B1 X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications