WO2020209868A1
|
|
A system and method for diffraction-based structure determination with simultaneous processing modules
|
US2019056514A1
|
|
Indirect photon-counting analytical X-ray detector
|
US2020033275A1
|
|
Divergent beam two dimensional diffraction
|
US2018372658A1
|
|
X-ray diffraction device and method to measure stress with 2D detector and single sample tilt
|
US2018292334A1
|
|
Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector
|
US2017343490A1
|
|
Two-dimensional X-ray detector position calibration and correction with diffraction pattern
|
US2017176355A1
|
|
Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector
|
US2015369929A1
|
|
X-ray detector operable in a mixed photon-counting/analog output mode
|
US2015346121A1
|
|
Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector
|
US2015276629A1
|
|
Method of conducting an X-ray diffraction-based crystallography analysis
|
US2015103980A1
|
|
X-ray diffraction based crystal centering method using an active pixel array sensor in rolling shutter mode
|
US2015016594A1
|
|
X-ray diffraction-based defective pixel correction method using an active pixel array sensor
|
US2014264046A1
|
|
One-dimensional x-ray detector with curved readout strips
|
US2014192959A1
|
|
Method and apparatus for surface mapping using in-plane grazing incidence diffraction
|
EP2773949A1
|
|
Multiply-sampled cmos sensor for x-ray diffraction measurements with corrections for non-ideal sensor behavior
|
CN103930773A
|
|
Method for correcting timing skew in X-ray data read out of X-ray detector in rolling shutter mode
|
EP2564186A2
|
|
Method and apparatus for using an area x-ray detector as a point detector in an x-ray diffractometer
|
US7885383B1
|
|
Method for measuring crystallite size with a two-dimensional X-ray diffractometer
|
US7660389B1
|
|
Sample alignment mechanism for X-ray diffraction instrumentation
|
US7928400B1
|
|
X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications
|