| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 7 | |
| #2 | Taiwan | 6 | |
| #3 | Japan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Electrical machinery and energy | |
| #3 | Semiconductors | |
| #4 | Engines, pumps and turbines | |
| #5 | Medical technology |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Semiconductor devices | |
| #3 | X-ray microscopes | |
| #4 | Measuring length, angles and areas | |
| #5 | Electric discharge tubes | |
| #6 | X-ray technique |
| # | Name | Total Patents |
|---|---|---|
| #1 | Mazor Isaac | 9 |
| #2 | Wormington Matthew | 7 |
| #3 | Dikopoltsev Alex | 5 |
| #4 | Wall John Leonard | 4 |
| #5 | Tokar Alex | 4 |
| #6 | Peled Asher | 3 |
| #7 | Ryan Paul Anthony | 3 |
| #8 | Krokhmal Alex | 2 |
| #9 | Atrash Fouad | 2 |
| #10 | Ostrovsky Olga | 2 |
| Publication | Filing date | Title |
|---|---|---|
| US2016123909A1 | Measurement of small features using XRF | |
| US9748070B1 | X-ray tube anode | |
| US2015369761A1 | Using multiple sources/detectors for high-throughput X-ray topography measurement | |
| US2015369759A1 | X-ray scatterometry apparatus | |
| US2015330921A1 | Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF | |
| US2015243469A1 | X-ray source assembly | |
| US2015204806A1 | Angle calibration for grazing-incidence X-ray fluorescence (GIXRF) |