| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 10 | |
| #2 | Republic of Korea | 5 | |
| #3 | Taiwan | 5 | |
| #4 | Japan | 4 | |
| #5 | China | 3 | |
| #6 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Electrical machinery and energy | |
| #3 | Semiconductors | |
| #4 | Optics |
| # | Name | Total Patents |
|---|---|---|
| #1 | Wormington Matthew | 21 |
| #2 | Vinshtein Yuri | 14 |
| #3 | Krokhmal Alexander | 14 |
| #4 | Peled Asher | 8 |
| #5 | Dikopoltsev Alex | 5 |
| #6 | Kasper Nikolai | 4 |
| #7 | Vinshtein Juri | 4 |
| #8 | Sheaffer Guy | 4 |
| #9 | Krokhmal Alex | 4 |
| #10 | Krohmal Alexander | 3 |
| Publication | Filing date | Title |
|---|---|---|
| US2020168427A1 | X-ray tube | |
| WO2020008420A2 | Small-angle x-ray scatterometry | |
| JP2019191167A | X ray source optical system for small-angle x-ray scatterometry | |
| US2019317028A1 | Image contrast in X-ray topography imaging for defect inspection | |
| US2018348151A1 | X-ray fluorescence apparatus for contamination monitoring | |
| KR20180035710A | Closedloop control of xray knife edge | |
| US2017199136A1 | Method and apparatus for X-ray scatterometry |