| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Japan | 16 |
| # | Industry | |
|---|---|---|
| #1 | Computer technology | |
| #2 | Semiconductors | |
| #3 | Basic communication technologies | |
| #4 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Static stores | |
| #2 | Semiconductor devices | |
| #3 | Pulse technique | |
| #4 | Measuring electric variables | |
| #5 | Electric digital data processing |
| # | Name | Total Patents |
|---|---|---|
| #1 | Kraus William F | 4 |
| #2 | Verhaeghe Donald J | 3 |
| #3 | Wilson Dennis R | 3 |
| #4 | Argos George Jr | 2 |
| #5 | Eliason Jarrod | 2 |
| #6 | Alwais Michael | 2 |
| #7 | Yasu Yoshihiko | 2 |
| #8 | Evans Thomas | 1 |
| #9 | Schwartz Kurt | 1 |
| #10 | Mitra Sanjay | 1 |
| Publication | Filing date | Title |
|---|---|---|
| JP2010244675A | Method for mitigating imprint of ferroelectric memory | |
| JPH10302500A | System and method for controlling internal test mode in non-volatile memory usually through access |