NPTEST LLC has a total of 19 patent applications. Its first patent ever was published in 1999. It filed its patents most often in United States, Australia and EPO (European Patent Office). Its main competitors in its focus markets measurement, computer technology and electrical machinery and energy are ADVANTEST CORP, NIPPON DENSHI ZAIRYO KK and MICROMANIPULATOR COMPANY INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 10 | |
#2 | Australia | 3 | |
#3 | EPO (European Patent Office) | 3 | |
#4 | WIPO (World Intellectual Property Organization) | 2 | |
#5 | China | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Computer technology | |
#3 | Electrical machinery and energy | |
#4 | Semiconductors | |
#5 | Digital networks | |
#6 | Basic communication technologies | |
#7 | Machine tools |
# | Name | Total Patents |
---|---|---|
#1 | Wilsher Kenneth R | 6 |
#2 | Ho Francis | 3 |
#3 | Sauk Frank M | 2 |
#4 | Kardach Cathy | 2 |
#5 | Wells Gary A | 2 |
#6 | Shah Ketan J | 2 |
#7 | Lundquist Theodore | 2 |
#8 | West Burnell G | 2 |
#9 | Perdu Philippe | 2 |
#10 | Desplats Romain | 2 |
Publication | Filing date | Title |
---|---|---|
AU2003297662A1 | Apparatus end method for detecting photon emissions from transiators | |
US6744267B2 | Test system and methodology | |
US6855622B2 | Method and apparatus for forming a cavity in a semiconductor substrate using a charged particle beam | |
US6737853B2 | Photoconductive-sampling voltage measurement | |
US2003022603A1 | Method for global die thinning and polishing of flip-chip packaged integrated circuits | |
US6748564B1 | Scan stream sequencing for testing integrated circuits | |
US6630667B1 | Compact, high collection efficiency scintillator for secondary electron detection | |
US6622107B1 | Edge placement and jitter measurement for electronic elements | |
US6661836B1 | Measuring jitter of high-speed data channels |