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NO 47 INST CHINA ELECTRONICS TECHNOLOGY GROUP CORP

Overview
  • Total Patents
    36
  • GoodIP Patent Rank
    44,598
About

NO 47 INST CHINA ELECTRONICS TECHNOLOGY GROUP CORP has a total of 36 patent applications. Its first patent ever was published in 2013. It filed its patents most often in China. Its main competitors in its focus markets semiconductors, computer technology and environmental technology are TELA INNOVATIONS INC, LERNER RALF and SILICON SPACE TECHNOLOGY CORP.

Patent filings in countries

World map showing NO 47 INST CHINA ELECTRONICS TECHNOLOGY GROUP CORPs patent filings in countries
# Country Total Patents
#1 China 36

Patent filings per year

Chart showing NO 47 INST CHINA ELECTRONICS TECHNOLOGY GROUP CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Niu Yingshan 8
#2 Sun Dacheng 4
#3 Liu Yang 4
#4 Tang Dong 4
#5 Jiang Shuo 3
#6 Wang Huan 3
#7 Wang Shuang 3
#8 Wang Peng 3
#9 Chen Zhi 3
#10 Yang Dawei 3

Latest patents

Publication Filing date Title
CN105204563A Reference current compensation method and circuit for DAC
CN105244288A Method for packaging integrated circuit
CN105188337A Grain noise detection fixture, device and method
CN105004752A Thermal resistance test method for multi-die device
CN104865517A Testing and debugging circuit
CN104882162A Word line voltage converting drive circuit
CN104850527A Communication protocol processor
CN104834629A Bus type central processing unit
CN104821804A Delay flip-flop with reset terminal
CN104821805A Delay flip-flop
CN104811162A D flip-flop with set terminal
CN104809094A SPI (Serial Peripheral Interface) controller and communication method for SPI controller
CN104852712A Low-power-consumption gated clock circuit structure based on data variation
CN104793723A Low-power-consumption control circuit based on level detection
CN104794089A Improved UART communication method, device and system suitable for single chip microcomputers
CN104780086A CAN bus communication method and system for environment monitoring
CN104462729A Layout method for anti-fuse field-programmable gate array
CN104658613A EEPROM durability test method and EEPROM durability test device
CN104462726A Wiring method for field-programmable gate array used for anti-fuse series
CN104465777A Method for increasing breakdown voltage of MOS device and MOS device