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Hard macro test circuit, testing method therefor, and method of generating test pattern
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Rake receiver
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Layout design method of semiconductor device
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Layout design method of semiconductor device
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Device and method for graphic processing
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Oscillation circuit
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Automatic layout/wiring method of large-scale integrated circuit device
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Layout design method
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Method and device for transmitting signal and data processor
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Buffer
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Automatic correction circuit for variation in resistance and its method
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Operation processor linked with software and its method
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Device and method for image processing
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