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INFINEON TECHNOLOGIES CORP

Overview
  • Total Patents
    1,285
  • GoodIP Patent Rank
    215,872
About

INFINEON TECHNOLOGIES CORP has a total of 1,285 patent applications. Its first patent ever was published in 1995. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Taiwan. Its main competitors in its focus markets semiconductors, computer technology and basic communication technologies are HYUNDAI MICRO ELECTRONICS CO, FUJITSU MICROELECTRONICS LTD and HYUNDAI ELECTRONICS IND.

Patent filings per year

Chart showing INFINEON TECHNOLOGIES CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Gruening Ulrike 76
#2 Mueller Gerhard 55
#3 Mandelman Jack A 40
#4 Radens Carl J 37
#5 Kunkel Gerhard 36
#6 Tews Helmut Horst 35
#7 Kudelka Stephan 34
#8 Michaelis Alexander 33
#9 Weinfurtner Oliver 32
#10 Kirihata Toshiaki 29

Latest patents

Publication Filing date Title
US2014225672A1 Input match network with RF bypass path
US2015123208A1 Transformer input matched transistor
US2014346637A1 Hybrid semiconductor package
US8736379B1 Input match network for a power circuit
US2014167634A1 Method and circuit for LED driver dimming
US2014125306A1 Switching Regulator Control with Nonlinear Feed-Forward Correction
US2014118070A1 Doherty amplifier circuit with phase-controlled load modulation
US7772904B1 Voltage level converter with mixed signal controller
US2010031026A1 Method and system for transferring information to a device
US2009003033A1 Quasi-differential read operation
US2008266990A1 Flexible redundancy replacement scheme for semiconductor device
US2008233709A1 Method for removing material from a semiconductor
US2008199784A1 Small feature integrated circuit fabrication
US2008025128A1 Memory system
US2007253262A1 Method and apparatus for early write termination in a semiconductor memory
US2007201267A1 Sense circuit for resistive memory
US2006233029A1 Random access memory having voltage provided out of boosted supply voltage
US2006268632A1 Integrated circuit chip having a first delay circuit trimmed via a second delay circuit
US2006282747A1 ECC flag for testing on-chip error correction circuit
US2006248413A1 Voltage monitoring test mode and test adapter