METRON SYSTEMS INC has a total of 13 patent applications. Its first patent ever was published in 2000. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Australia. Its main competitors in its focus markets measurement and optics are NANOFOCUS AG, DOWNS MICHAEL JOHN and SUZHOU H&L INSTR LLC.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 6 | |
#2 | WIPO (World Intellectual Property Organization) | 4 | |
#3 | Australia | 3 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Optics |
# | Technology | |
---|---|---|
#1 | Measuring length, angles and areas | |
#2 | Radio navigation | |
#3 | Optical systems |
# | Name | Total Patents |
---|---|---|
#1 | Johnston Kyle S | 13 |
#2 | Clary Thomas R | 7 |
#3 | Nelson Spencer G | 7 |
#4 | Franklin Joseph A | 6 |
#5 | Bass Charles M | 6 |
#6 | Lock Tomas E | 4 |
#7 | Greenberg Heath M | 4 |
#8 | Ridge Joseph D | 3 |
Publication | Filing date | Title |
---|---|---|
AU2003285098A1 | Calibration for 3d measurement system | |
AU2003284961A1 | High precision optical imaging systems and related systems | |
WO2004029540A2 | Determination of the angular position of a laser beam | |
US6441908B1 | Profiling of a component having reduced sensitivity to anomalous off-axis reflections |