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NANOFOCUS AG

Overview
  • Total Patents
    42
  • GoodIP Patent Rank
    91,598
  • Filing trend
    ⇩ 72.0%
About

NANOFOCUS AG has a total of 42 patent applications. It decreased the IP activity by 72.0%. Its first patent ever was published in 2001. It filed its patents most often in WIPO (World Intellectual Property Organization), EPO (European Patent Office) and Germany. Its main competitors in its focus markets measurement, optics and computer technology are METRON SYSTEMS INC, DOWNS MICHAEL JOHN and SUZHOU H&L INSTR LLC.

Patent filings per year

Chart showing NANOFOCUS AGs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Frank Johannes 16
#2 Weber Mark A 15
#3 Jakob Gerd 11
#4 Spengler Michael 6
#5 Valentin Juergen 4
#6 Grigat Marcus 4
#7 Weber Mark 3
#8 Schreier Hans-Hermann 2
#9 Valentin Jürgen 2
#10 Jordan Hans-Joachim 1

Latest patents

Publication Filing date Title
DE102017130211A1 Method and device for optical surface measurement with the aid of a confocal sensor
DE102016115827A1 Method and device for optical surface measurement with the aid of a chromatic confocal sensor
WO2016139255A1 Method and apparatus for checking and measuring needle card adapters
DE102016100261A1 Method for electronic analysis of a time-varying signal
DE102013008278A1 Method and device for 3-D measurement of the skin surface and skin layers close to the surface
DE102012021179A1 Method for magnification of resolving power in line scanning technical surface, involves locating focusing lens next to optical element on line at regular intervals so that light spot of line are arranged offset from each other
DE102008031412A1 Device i.e. line scanner, for monitoring measuring points on object surface to be measured, has focus plane displaceable parallel to object surface, where object surface is displaceable lateral to focus plane
US2009103175A1 Device and method for high-intensity uniform illumination with minimal light reflection for use in microscopes
EP2018586A1 Method for generating a universal pinhole pattern for use in confocal microscopes
DE102005022819A1 Method for determining the absolute thickness of non-transparent and transparent samples by means of confocal measuring technology
WO2005100942A1 Method for optically detecting leaks in gas-tight housings especially of micro-electro-mechanical systems (mems)
DE102004044343A1 High resolution microscope with coherent illumination measures amplitude, phase of object wave in far field, reconstructs field distribution in object field from this data; signal arising from detector noise outside object region is nulled
AU2003294623A1 Device and method for measuring surfaces on the internal walls of cylinders, using confocal microscopes
US6853459B2 Scanning using position transmission for triggering the recording of measured values
US6943823B2 Method and device for producing height images of technical surfaces with microscopic resolution