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NANO SYSTEM CO LTD

Overview
  • Total Patents
    15
  • GoodIP Patent Rank
    202,564
About

NANO SYSTEM CO LTD has a total of 15 patent applications. Its first patent ever was published in 2004. It filed its patents most often in Republic of Korea and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, computer technology and optics are ZEISS IND MESSTECHNIK GMBH, TROPEL CORP and HOMMELWERKE GMBH.

Patent filings in countries

World map showing NANO SYSTEM CO LTDs patent filings in countries

Patent filings per year

Chart showing NANO SYSTEM CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lee Hyung Seok 12
#2 Kim Ho Hwan 3
#3 Kim Chang Kyu 3
#4 Lee Keunwoo 2
#5 Lee Hyung-Seok 2
#6 Oh Hyun Woo 1
#7 Kwon Yong Kwan 1
#8 Lim Beom Su 1
#9 Kim Ju Sung 1
#10 Kim Gee Hong 1

Latest patents

Publication Filing date Title
KR102081085B1 Device and method for measuring shape of 3D free-form surface
KR20200009776A Location Correction apparatus for controlling Actuator location and Control Method Therefor
KR102043279B1 Tree Dimensional Shape Measurement Interferometer having tilt unit
KR101462046B1 Apparatus for cutting edge of glass plate
KR101254297B1 Method and system for measuring thickness and surface profile
KR101065467B1 Display apparatus with light emitting diode electronic sign board
KR20120097207A Apparatus for regulating optical path of interference system and optical path regulation method using the same
WO2009088120A1 Self-compensating apparatus of interference-fringe-generating position to compensate optical path difference result from objectives lens working distance variation for environment temperature variation in regard of interference lens
KR20090075594A Self-compensating apparatus of Interference-Fringe-Generating position to compensate Optical Path Difference result from Objectives Lens Working Distance variation for environment temperature variation in regard of Interference Lens
KR20090010360A A 3d shape measuring system using lateral scan
KR20090010350A 3d shape measuring system using projection
KR20080113524A A 3d shape measuring system in real time
KR20070045017A Three dimensional shape measuring apparatus
KR20050119008A Phase shifting method and system for horizontal scanning of light phase interferrometry”