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LITEL INSTR INC

Overview
  • Total Patents
    83
  • GoodIP Patent Rank
    215,244
About

LITEL INSTR INC has a total of 83 patent applications. Its first patent ever was published in 1990. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Australia. Its main competitors in its focus markets optics, machine tools and audio-visual technology are Micronic Mydata AB, TAIYO INK SEIZO KK and ANVIK CORP.

Patent filings per year

Chart showing LITEL INSTR INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Smith Adlai H 68
#2 Hunter Jr Robert O 49
#3 Mcarthur Bruce B 28
#4 Smith Adlai 14
#5 Macdonald Bruce G 10
#6 Mcarthur Bruce 9
#7 Hunter Robert O Jr 7
#8 Hunter Jr Robert 5
#9 Guest Clark C 5
#10 Hunter Robert O 5

Latest patents

Publication Filing date Title
US2017023365A1 System and method for advanced navigation
US2015324989A1 Method and system for high accuracy and reliability registration of multi modal imagery
US2006209276A1 Method and apparatus for self-referenced wafer stage positional error mapping
US2007072091A1 Reference wafer and process for manufacturing same
WO2006078843A1 Method and apparatus for determination of source polarization matrix
US7598006B1 Method and apparatus for embedded encoding of overlay data ordering in an in-situ interferometer
US2006109438A1 Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion
US7544449B1 Method and apparatus for measurement of crossfield chromatic response of projection imaging systems
US2006007431A1 Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion
US2005237512A1 Method and apparatus for measurement of exit pupil transmittance
US2005219516A1 Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion
JP2006066455A Dynamic step of self-reference and method and device for scanning distortion in scanning field
US2006042106A1 Method and apparatus for registration with integral alignment optics
JP2006059913A Method and apparatus for dynamic step in self reference and lens distortion in scanning field
US2005254027A1 Process for amelioration of scanning synchronization error
US2005254040A1 Apparatus and process for the determination of static lens field curvature
US2005243294A1 Apparatus and process for determination of dynamic scan field curvature
US2005243309A1 Apparatus and process for determination of dynamic lens field curvature
US2005231705A1 Apparatus and method for high resolution in-situ illumination source measurement in projection imaging systems
US7261985B2 Process for determination of optimized exposure conditions for transverse distortion mapping